✦ LIBER ✦
Increased Radiation Hardness of Short-Channel Electron-Irradiated Si 1- x Ge x Source/Drain p-Type Metal Oxide Semiconductor Field-Effect Transistors at Higher Ge Content
✍ Scribed by Nakashima, Toshiyuki; Yoneoka, Masashi; Tsunoda, Isao; Takakura, Kenichiro; Gonzalez, Mireia Bargallo; Simoen, Eddy; Claeys, Cor; Yoshino, Kenji
- Book ID
- 125536774
- Publisher
- Institute of Pure and Applied Physics
- Year
- 2013
- Tongue
- English
- Weight
- 238 KB
- Volume
- 52
- Category
- Article
- ISSN
- 0021-4922
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