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Increased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germanium

✍ Scribed by Zhu, G.; Lee, H.; Lan, Y.; Wang, X.; Joshi, G.; Wang, D.; Yang, J.; Vashaee, D.; Guilbert, H.; Pillitteri, A.


Book ID
115478422
Publisher
The American Physical Society
Year
2009
Tongue
English
Weight
949 KB
Volume
102
Category
Article
ISSN
0031-9007

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