In vivo measurement of the brain and skull resistivities using an EIT-based method and the combined analysis of SEF/SEP data

✍ Scribed by Goncalve, S.; de Munck, J.C.; Verbunt, J.P.A.; Heethaar, R.M.; da Silva, F.H.L.

• Book ID: 114602543
• Publisher: IEEE
• Year: 2003
• Tongue: English
• Weight: 268 KB
• Volume: 50
• Category: Article
• ISSN: 0018-9294
• DOI: 10.1109/tbme.2003.816072