✦ LIBER ✦

In situConductance Measurement of Surface Phases on Silicon by the Four-Probe Method

✍ Scribed by I. A. Belous; O. V. Utas; D. A. Tsukanov; V. G. Lifshits

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Oxidation of clean silicon surfaces stud

✍ C.L. Petersen; F. Grey; M. Aono 📂 Article 📅 1997 🏛 Elsevier Science 🌐 English ⚖ 472 KB

On the four-probe method of resistivity

✍ James, D W F; Jones, R G 📂 Article 📅 1965 🏛 Institute of Physics 🌐 English ⚖ 127 KB

Direct measurement of surface-state cond

✍ Hasegawa, Shuji; Shiraki, Ichiro; Tanikawa, Takehiro; Petersen, Christian L; Han 📂 Article 📅 2002 🏛 Institute of Physics 🌐 English ⚖ 786 KB

The accuracy of four-probe resistivity m

✍ Hargreaves, J K; Millard, D 📂 Article 📅 1962 🏛 Institute of Physics 🌐 English ⚖ 329 KB

An instrument for measuring the electric

✍ V. M. Vladimirov; E. F. Grinin; M. E. Sergii; V. N. Shepov 📂 Article 📅 2010 🏛 Springer US 🌐 English ⚖ 257 KB

On the localness of the four-probe metho

✍ N. N. Polyakov 📂 Article 📅 1973 🏛 Springer 🌐 English ⚖ 335 KB