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In-Situ X-ray Scattering Study of Continuous Silica−Surfactant Self-Assembly during Steady-State Dip Coating

✍ Scribed by Doshi, Dhaval A.; Gibaud, Alain; Liu, Nanguo; Sturmayr, Dietmar; Malanoski, Anthony P.; Dunphy, Darren R.; Chen, Hongji; Narayanan, Suresh; MacPhee, Andrew; Wang, Jin; Reed, Scott T.; Hurd, Alan J.; van Swol, Frank; Brinker, C. Jeffrey

Book ID: 125930596
Publisher: American Chemical Society
Year: 2003
Tongue: English
Weight: 331 KB
Volume: 107
Category: Article
ISSN: 0022-3654
DOI: 10.1021/jp027214i

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✍ Tate, Michael P.; Eggiman, Brian W.; Kowalski, Jonathan D.; Hillhouse, Hugh W. 📂 Article 📅 2005 🏛 American Chemical Society 🌐 English ⚖ 331 KB