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In situ X-ray diffraction under H2 of the pseudo-AB2 compounds: YNi3.5Al0.5Mg

✍ Scribed by C. Stan; E. Andronescu; K. Asano; K. Sakaki; J.-L. Bobet

Book ID: 108145120
Publisher: Elsevier Science
Year: 2008
Tongue: English
Weight: 405 KB
Volume: 33
Category: Article
ISSN: 0360-3199
DOI: 10.1016/j.ijhydene.2008.02.009

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