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In situ X-ray diffraction study of self-forming barriers from a Cu–Mn alloy in 100 nm Cu/low-k damascene interconnects using synchrotron radiation

✍ Scribed by Christopher J. Wilson; Henny Volders; Kristof Croes; Marianna Pantouvaki; Gerald P. Beyer; Alton B. Horsfall; Anthony G. O’Neill; Zsolt Tőkei


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
417 KB
Volume
87
Category
Article
ISSN
0167-9317

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