In situ transmission electron microscopy study on Nb-doped Pb(Zr0.95Ti0.05)O3 ceramics
✍ Scribed by Weiguo Qu; Xiaoli Tan; Pin Yang
- Publisher
- John Wiley and Sons
- Year
- 2009
- Tongue
- English
- Weight
- 367 KB
- Volume
- 72
- Category
- Article
- ISSN
- 1059-910X
No coin nor oath required. For personal study only.
✦ Synopsis
Abstract
The ferroelectric‐to‐ferroelectric phase transition between the high temperature (FE~RH~) and the low temperature (FE~RL~) rhombohedral phases in a Nb‐doped Pb(Zr~0.95~Ti~0.05~)O~3~ ceramic was investigated with transmission electron microscopy (TEM). Both bright field images and electron diffraction patterns were monitored as a function of temperature as well as dc electric field. A special TEM specimen holder that permits the application of electric voltage up to 600 V was employed for the study of electric field‐induced phase transition. It was found that both 1/2~c~‐ and 1/2~c~‐type superlattice diffraction spots were present at room temperature when the specimen was under no electric field. The 1/2~c~‐type superlattice spots were observed to disappear during heating above the phase transition temperature. When dc electric fields were applied at room temperature, the 1/2~c~‐type superlattice spots vanished as the electric field‐induced FE~RL~ → FE~RH~ phase transition occurred. Microsc. Res. Tech. 2009. © 2009 Wiley‐Liss, Inc.