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In situ transmission electron microscopy-investigations on the strain-induced B19′-phase in NiTi shape memory alloys structured by focused ion beam

✍ Scribed by A. Kröger; R. Wernhardt; Ch. Somsen; G. Eggeler; A. Wieck


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
967 KB
Volume
438-440
Category
Article
ISSN
0921-5093

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