✦ LIBER ✦
In-situ testability design (ISTD)—a new approach for testing high-speed LSI/VLSI logic : Frank F. Tsui. Proc. IEEE70 (1), 59 (1982)
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 119 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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