𝔖 Bobbio Scriptorium
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In situ technique for measuring the orthogonality of a plane wave to a substrate

✍ Scribed by Châteauneuf, Marc; Ayliffe, Michael H.; Kirk, Andrew G.


Book ID
115425888
Publisher
Optical Society of America
Year
2003
Tongue
English
Weight
559 KB
Volume
28
Category
Article
ISSN
0146-9592

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