✦ LIBER ✦
In situ synchrotron radiation grazing incidence X-ray diffraction—A powerful technique for the characterization of solid-state ion-selective electrode surfaces
✍ Scribed by Roland De Marco; Zhong-Tao Jiang; Bobby Pejcic; Arie van Riessen
- Book ID
- 108118785
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 340 KB
- Volume
- 51
- Category
- Article
- ISSN
- 0013-4686
No coin nor oath required. For personal study only.