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In situ surface x-ray scattering measurements of electrochemically deposited bismuth on silver(111): structure, compressibility, and comparison with ex situ low-energy electron diffraction measurements

โœ Scribed by Toney, Michael F.; Gordon, Joseph G.; Samant, Mahesh G.; Borges, Gary L.; Wiesler, David G.; Yee, Dennis.; Sorensen, Larry B.


Book ID
127307853
Publisher
American Chemical Society
Year
1991
Tongue
English
Weight
959 KB
Volume
7
Category
Article
ISSN
0743-7463

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