In situ stress relaxation and diffraction studies across the metal–insulator transition in epitaxial and polycrystalline SmNiO3 thin films

✍ Scribed by B. Viswanath; G.H. Aydogdu; S.D. Ha; S. Ramanathan

• Book ID: 113899360
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 541 KB
• Volume: 66
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/j.scriptamat.2011.12.018