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In-situ SEM studies of grain boundary migration during recrystallization of cold-rolled nickel

โœ Scribed by R. Le Gall; G. Liao; G. Saindrenan


Book ID
114388826
Publisher
Elsevier Science
Year
1999
Tongue
English
Weight
175 KB
Volume
41
Category
Article
ISSN
1359-6462

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