In-situ SEM investigation of sub-microscale deformation fields around a crack-tip in silicon

✍ Scribed by J.J. Li; C.W. Zhao; Y.M. Xing; X.H. Hou; Z.C. Fan; Y.J. Jin; Y. Wang

• Book ID: 119337414
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 989 KB
• Volume: 50
• Category: Article
• ISSN: 0143-8166
• DOI: 10.1016/j.optlaseng.2012.07.017