In-situ reflectivity observation of GaN layers grown directly on sapphire by HVPE using low-temperature nucleation layers

✍ Scribed by D. Martin; J. Napierala; H. J. Bühlmann; M. Ilegems

• Publisher: John Wiley and Sons
• Year: 2005
• Tongue: English
• Weight: 140 KB
• Volume: 2
• Category: Article
• ISSN: 1862-6351
• DOI: 10.1002/pssc.200461346