In-situ Raman spectroscopy used to study and control the initial growth phase of microcrystalline absorber layers for thin-film silicon solar cells

✍ Scribed by Stefan Muthmann; Florian Köhler; Matthias Meier; Markus Hülsbeck; Reinhard Carius; Aad Gordijn

• Book ID: 119301084
• Publisher: Elsevier Science
• Year: 2012
• Tongue: English
• Weight: 475 KB
• Volume: 358
• Category: Article
• ISSN: 0022-3093
• DOI: 10.1016/j.jnoncrysol.2011.12.061