✦ LIBER ✦
In situ Raman characterization of CeO2 thin films sputtered on (111) Si in order to optimize the post growth annealing parameters
✍ Scribed by Guhel, Y.; Bernard, J.; Boudart, B.
- Book ID
- 123369553
- Publisher
- Elsevier Science
- Year
- 2014
- Tongue
- English
- Weight
- 990 KB
- Volume
- 118
- Category
- Article
- ISSN
- 0167-9317
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