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In-situ optical reflectance and synchrotron X-ray topography study of defects in epitaxial dilute GaAsN on GaAs

✍ Scribed by O. Reentilä; A. Lankinen; M. Mattila; A. Säynätjoki; T. O. Tuomi; H. Lipsanen; L. O’Reilly; P. J. McNally

Book ID
106397778
Publisher
Springer US
Year
2007
Tongue
English
Weight
366 KB
Volume
19
Category
Article
ISSN
0957-4522

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