In situ observation of the orientation relationship at the interface plane between substrate and nucleus using X-ray scattering techniques

✍ Scribed by Brown, A.J.; Dong, H.B.; Howes, P.B.; Nicklin, C.L.

• Book ID: 122199439
• Publisher: Elsevier Science
• Year: 2014
• Tongue: English
• Weight: 554 KB
• Volume: 77
• Category: Article
• ISSN: 1359-6462
• DOI: 10.1016/j.scriptamat.2014.01.023