In situ observation of indium nanoparticles deposited on Si thin films by ultrahigh vacuum field emission transmission electron microscope

✍ Scribed by Miyoko Tanaka; Masaki Takeguchi; Kazuo Furuya

• Book ID: 117219657
• Publisher: Elsevier Science
• Year: 1999
• Tongue: English
• Weight: 400 KB
• Volume: 433-435
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/s0039-6028(99)00483-5