In situ observation of electrode surfaces using scanning Maxwell-stress microscopy under water

✍ Scribed by Hirata, Yoshiki; Mizutani, Fumio; Yokoyama, Hiroshi

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 446 KB
• Volume: 27
• Category: Article
• ISSN: 0142-2421
• DOI: 10.1002/(sici)1096-9918(199905/06)27:5/6<317::aid-sia525>3.0.co;2-q

✦ Synopsis

We present the results of a recent attempt to extend scanning Maxwell-stress microscopy (SMM) to aqueous environments. Scanning Maxwell-stress microscopy is a type of scanning probe microscopy designed to image microscopic electrical properties, such as the local surface potential distribution. In particular, the non-resonant behaviour of SMM makes it fundamentally suitable for underwater operations, in contrast to other resonant-type electric force microscopes. From underwater operations of SMM, the high viscosity of an aqueous solution can be made immaterial by making the driving frequency sufficiently low, whereas the large dielectric permitivity of water is always quite advantageous in enhancing the electric forces. Furthermore, the electrochemical potentials of stylus and sample are controlled independently and simultaneously during SMM by using a dual potentiostat. This makes it possible for in situ observation of charge on the electrode surface during an electrochemical reaction.