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In-Situ Monitoring of the Solid-State Microstructure Evolution of Polymer:Fullerene Blend Films Using Field-Effect Transistors

✍ Scribed by John G. Labram; Ester Buchaca Domingo; Natalie Stingelin; Donal D. C. Bradley; Thomas D. Anthopoulos


Publisher
John Wiley and Sons
Year
2010
Tongue
English
Weight
873 KB
Volume
21
Category
Article
ISSN
1616-301X

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