In situ monitoring of the c( 4 × 4) to the 2 × 4 surface phase transformation on GaAs(001) by grazing incidence X-ray diffraction

✍ Scribed by V.H. Etgens; M. Sauvage-Simkin; R. Pinchaux; J. Massies; N. Jedrecy; A. Waldhauer; N. Greiser

• Book ID: 116066826
• Publisher: Elsevier Science
• Year: 1994
• Tongue: English
• Weight: 656 KB
• Volume: 320
• Category: Article
• ISSN: 0039-6028
• DOI: 10.1016/0039-6028(94)90313-1