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In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation

โœ Scribed by Muriel Thomasset; Thierry Moreno; Blandine Capitanio; Mourad Idir; Samuel Bucourt


Publisher
Elsevier Science
Year
2010
Tongue
English
Weight
957 KB
Volume
616
Category
Article
ISSN
0168-9002

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