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In-situ metrology for the optimization of bent crystals used in hard-X-ray monochromators: Comparison between measurement and simulation
โ Scribed by Muriel Thomasset; Thierry Moreno; Blandine Capitanio; Mourad Idir; Samuel Bucourt
- Publisher
- Elsevier Science
- Year
- 2010
- Tongue
- English
- Weight
- 957 KB
- Volume
- 616
- Category
- Article
- ISSN
- 0168-9002
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