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In situ measurement of stress in Co/Cu, Co/Pd, and Co/Au compositionally modulated multilayer films

✍ Scribed by Awano, H.; Suzuki, Y.; Katayama, T.; Itoh, A.

Book ID: 120008364
Publisher: American Institute of Physics
Year: 1990
Tongue: English
Weight: 489 KB
Volume: 68
Category: Article
ISSN: 0021-8979
DOI: 10.1063/1.346163

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