✦ LIBER ✦
In situ IR observation of electromigration induced damage in heavily doped polycrystalline silicon resistors : J. R. Lloyd, G. S. Hopper and W. B. Roush. Proc. IEEE Reliab. Phys. Symp., 47 (1982)
- Book ID
- 103279098
- Publisher
- Elsevier Science
- Year
- 1983
- Tongue
- English
- Weight
- 112 KB
- Volume
- 23
- Category
- Article
- ISSN
- 0026-2714
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