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In Situ Investigation of Si-TPA-MFI Crystallization Using (Ultra-) Small- and Wide-Angle X-ray Scattering

✍ Scribed by de Moor, Peter-Paul E. A.; Beelen, Theo P. M.; Komanschek, Bernd U.; Diat, Olivier; van Santen, Rutger A.

No coin nor oath required. For personal study only.

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