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In Situ HREM Irradiation Study of an Intrinsic Point Defects Clustering in FZ-Si

✍ Scribed by L. Fedina; A. Gutakovskii; A. Aseev

Publisher: John Wiley and Sons
Year: 2000
Tongue: English
Weight: 977 KB
Volume: 35
Category: Article
ISSN: 0232-1300
DOI: 10.1002/1521-4079(200007)35:6/7<775::aid-crat775>3.0.co;2-3

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