✦ LIBER ✦
In Situ High Temperature X-Ray Diffraction Reveals Residual Stress Depth-Profiles in Blasted TiN Hard Coatings
✍ Scribed by M. Bartosik; R. Pitonak; J. Keckes
- Publisher
- John Wiley and Sons
- Year
- 2011
- Tongue
- English
- Weight
- 741 KB
- Volume
- 13
- Category
- Article
- ISSN
- 1438-1656
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