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In situ examination of oxygen non-stoichiometry in La0.80Sr0.20CoO3−δ thin films at intermediate and low temperatures by x-ray diffraction

✍ Scribed by Biegalski, M. D.; Crumlin, E.; Belianinov, A.; Mutoro, E.; Shao-Horn, Y.; Kalinin, S. V.


Book ID
121761104
Publisher
American Institute of Physics
Year
2014
Tongue
English
Weight
816 KB
Volume
104
Category
Article
ISSN
0003-6951

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