In-situ evaluation of the anodic oxide growth on Hg1−xCdxTe (MCT) using ellipsometry and second harmonic generation

✍ Scribed by A. W. Wark; L. E. A. Berlouis; F. K. Cruickshank; D. Pugh; P. F. Brevet

• Book ID: 107452544
• Publisher: Springer US
• Year: 2000
• Tongue: English
• Weight: 303 KB
• Volume: 29
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/s11664-000-0199-9