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In-situ ellipsometry on sputtered dielectric and magneto-optic thin films

✍ Scribed by Scott Heckens; John A. Woollam

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 381 KB
Volume: 270
Category: Article
ISSN: 0040-6090
DOI: 10.1016/0040-6090(95)06883-x

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