In situ ellipsometry for control of Hg1−xCdxTe nanolayer structures and inhomogeneous layers during MBE growth

✍ Scribed by V.A. Shvets; S.V. Rykhlitski; E.V. Spesivtsev; N.A. Aulchenko; N.N. Mikhailov; S.A. Dvoretsky; Yu.G. Sidorov; R.N. Smirnov

• Book ID: 113936698
• Publisher: Elsevier Science
• Year: 2004
• Tongue: English
• Weight: 187 KB
• Volume: 455-456
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/j.tsf.2003.11.239