✦ LIBER ✦

In-Situ Electron Microscopy Volume 129 (Applications in Physics, Chemistry and Materials Science) || Current-Induced Transport: Electromigration

✍ Scribed by Dehm, Gerhard; Howe, James M.; Zweck, Josef

Book ID: 111937593
Publisher: Wiley-VCH Verlag GmbH & Co. KGaA
Year: 2012
Tongue: German
Weight: 371 KB
Edition: 1
Category: Article
ISBN: 3527319735
DOI: 10.1002/9783527652167.ch12

No coin nor oath required. For personal study only.

✦ Synopsis

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

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