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In-Situ Electron Microscopy (Applications in Physics, Chemistry and Materials Science) || In-Situ TEM with Electrical Bias on Ferroelectric Oxides

โœ Scribed by Dehm, Gerhard; Howe, James M.; Zweck, Josef


Book ID
120812506
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Year
2012
Weight
555 KB
Category
Article
ISBN
3527319735

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In-Situ Electron Microscopy (Application
โœ Dehm, Gerhard; Howe, James M.; Zweck, Josef ๐Ÿ“‚ Article ๐Ÿ“… 2012 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 350 KB

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples

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โœ Dehm, Gerhard; Howe, James M.; Zweck, Josef ๐Ÿ“‚ Article ๐Ÿ“… 2012 ๐Ÿ› Wiley-VCH Verlag GmbH & Co. KGaA ๐ŸŒ German โš– 537 KB

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples

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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples