Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples
In-Situ Electron Microscopy (Applications in Physics, Chemistry and Materials Science) || In-Situ TEM with Electrical Bias on Ferroelectric Oxides
โ Scribed by Dehm, Gerhard; Howe, James M.; Zweck, Josef
- Book ID
- 120812506
- Publisher
- Wiley-VCH Verlag GmbH & Co. KGaA
- Year
- 2012
- Weight
- 555 KB
- Category
- Article
- ISBN
- 3527319735
No coin nor oath required. For personal study only.
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Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples
Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples