๐”– Bobbio Scriptorium
โœฆ   LIBER   โœฆ

In-Situ Electron Microscopy (Applications in Physics, Chemistry and Materials Science) || Mechanical Testing with the Scanning Electron Microscope

โœ Scribed by Dehm, Gerhard; Howe, James M.; Zweck, Josef

Book ID
120439466
Publisher
Wiley-VCH Verlag GmbH & Co. KGaA
Year
2012
Tongue
German
Weight
360 KB
Edition
1
Category
Article
ISBN
3527319735

No coin nor oath required. For personal study only.

โœฆ Synopsis

Adopting a didactical approach from fundamentals to actual experiments and applications, this handbook and ready reference covers real-time observations using modern scanning electron microscopy and transmission electron microscopy, while also providing information on the required stages and samples. The text begins with introductory material and the basics, before describing advancements and applications in dynamic transmission electron microscopy and reflection electron microscopy. Subsequently, the techniques needed to determine growth processes, chemical reactions and oxidation, irradiation effects, mechanical, magnetic, and ferroelectric properties as well as cathodoluminiscence and electromigration are discussed.

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