✦ LIBER ✦
In-situ electrical resistance measurement for determining minimum continuous thickness of Sn films by DC magnetron sputtering
✍ Scribed by Se-Hun Kwon; Na-Hyun Kwon; Pung-Keun Song; Kwun Nam Hui; Kwan-San Hui; Young-Rae Cho
- Book ID
- 113795472
- Publisher
- Elsevier Science
- Year
- 2012
- Tongue
- English
- Weight
- 553 KB
- Volume
- 73
- Category
- Article
- ISSN
- 0167-577X
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