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“In situ” determination of grain boundary migration rates by synchrotron white beam X-ray topography

✍ Scribed by Gastaldi, J. ;Jourdan, C. ;Grange, G. ;Bauer, C. L.

Publisher: John Wiley and Sons
Year: 1988
Tongue: English
Weight: 680 KB
Volume: 109
Category: Article
ISSN: 0031-8965
DOI: 10.1002/pssa.2211090205

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