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In-situ deformation of TiAl PST crystals in TEM

โœ Scribed by Ke-Fu Yao; Jianzhong Xiao; Junlin Zhang


Book ID
117682022
Publisher
Elsevier Science
Year
2000
Tongue
English
Weight
600 KB
Volume
8
Category
Article
ISSN
0966-9795

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Parallel twinning during creep deformati
โœ H.Y. Kim; K. Maruyama ๐Ÿ“‚ Article ๐Ÿ“… 2001 ๐Ÿ› Elsevier Science ๐ŸŒ English โš– 185 KB

Compression creep tests were conducted in the soft orientation PST TiAl crystals under the constant stress condition with applied stress of 100-316 MPa at 1150 K to investigate the effect of parallel twinning on creep deformation behavior. The effect of applied stress and strain on parallel twinning