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In situ Control of Atomic-Scale Si Layer with Huge Strain in the Nanoheterostructure NiSi/Si/NiSi through Point Contact Reaction

✍ Scribed by Lu, Kuo-Chang; Wu, Wen-Wei; Wu, Han-Wei; Tanner, Carey M.; Chang, Jane P.; Chen, Lih J.; Tu, K. N.


Book ID
120916931
Publisher
American Chemical Society
Year
2007
Tongue
English
Weight
582 KB
Volume
7
Category
Article
ISSN
1530-6984

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