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In situ characterization of pin diode waveforms using electro-optic sampling

✍ Scribed by Evelyn Benabe; Matthew H. Crites; John F. Whitaker; Thomas M. Weller

Book ID: 115560185
Publisher: John Wiley and Sons
Year: 2012
Tongue: English
Weight: 316 KB
Volume: 54
Category: Article
ISSN: 0895-2477
DOI: 10.1002/mop.27119

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