In situ characterization by reflectance difference spectroscopy of III–V materials and heterojunctions grown by low pressure metal organic chemical vapour deposition

✍ Scribed by O. Acher; F. Omnes; M. Razeghi; B. Drévillon

• Publisher: Elsevier Science
• Year: 1990
• Tongue: English
• Weight: 348 KB
• Volume: 5
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/0921-5107(90)90058-j