In Situ Characterisation of Polymer Surfaces and Thin Organic Films in Plasma Processing
โ Scribed by J. Meichsner
- Publisher
- John Wiley and Sons
- Year
- 1999
- Tongue
- English
- Weight
- 694 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0005-8025
No coin nor oath required. For personal study only.
๐ SIMILAR VOLUMES
Principle and limitations of real time spectroscopic ellipsometry are presented. The technical characteristics of the SOPRA ES4G OMA system are summarised and illustrated by practical examples. With 1024 pixels in a spectral range of 260-1060 nm, a reproducibility better than 10 -3 and the possibili
Frequency-dependent dielectric measurements, often called frequency-dependent electromagnetic sensing (FDEMS), made over many frequency ranges, Hz-MHz, provide a sensitive, convenient automated means for monitoring in situ the processing properties of thermosets and thermoplastics. Using a planar wa