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In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction

✍ Scribed by A. Steuwer; L. Edwards; S. Pratihar; S. Ganguly; M. Peel; M.E. Fitzpatrick; T.J. Marrow; P.J. Withers; I. Sinclair; K.D. Singh; N. Gao; T. Buslaps; J.-Y. Buffière


Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
485 KB
Volume
246
Category
Article
ISSN
0168-583X

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