In situ analysis of cracks in structural materials using synchrotron X-ray tomography and diffraction
✍ Scribed by A. Steuwer; L. Edwards; S. Pratihar; S. Ganguly; M. Peel; M.E. Fitzpatrick; T.J. Marrow; P.J. Withers; I. Sinclair; K.D. Singh; N. Gao; T. Buslaps; J.-Y. Buffière
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 485 KB
- Volume
- 246
- Category
- Article
- ISSN
- 0168-583X
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