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In-plane X-ray scattering of epitaxial structures

✍ Scribed by S.F. Cui; Y.T. Wang; Y. Zhuang; M. Li; Z.H. Mai

Publisher: Elsevier Science
Year: 1995
Tongue: English
Weight: 317 KB
Volume: 152
Category: Article
ISSN: 0022-0248
DOI: 10.1016/0022-0248(95)00125-5

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## Abstract The layer structure of a series of Fe/Au multilayers has been studied by grazing incidence specular and diffuse X‐ray scattering. In particular, the evolution of the layer and interface characteristics has been followed as a function of the number of bilayers grown. Torque magnetometry