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In-plane strain measurements on a microscopic scale by coupling digital image correlation and an in situ SEM technique

✍ Scribed by Fabienne Lagattu; Florent Bridier; Patrick Villechaise; Jean Brillaud


Book ID
113779887
Publisher
Elsevier Science
Year
2006
Tongue
English
Weight
454 KB
Volume
56
Category
Article
ISSN
1044-5803

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