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In-line characterization of dielectric constant and leakage currents of low-k films with corona charge method

✍ Scribed by D. Fossati; C. Beitia; L. Plantier; G. Imbert; S. Passefort; M. Desbois; F. Volpi; J.-C. Royer


Publisher
Springer US
Year
2007
Tongue
English
Weight
237 KB
Volume
19
Category
Article
ISSN
0957-4522

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