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In-line channel power monitor based on helium ion implantation in silicon-on-insulator waveguides

✍ Scribed by Liu, Y.; Chow, C.W.; Cheung, W.Y.; Tsang, H.K.

Book ID: 119803091
Publisher: IEEE
Year: 2006
Tongue: English
Weight: 611 KB
Volume: 18
Category: Article
ISSN: 1041-1135
DOI: 10.1109/lpt.2006.881246

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